A Study on Data-based Wafer Slope Adjustment Strategies for Yield Improvement in Customized Wafer Manufacturing

Publications

Publication Type

Domestic Journal

Contribution Type

Article

Authors

Jun Hyeok Gil & Jang Won Bae

Year

2025

Venue

Journal of the Korean Operations Research and Management Science Society

Citation

Vol. 50, No. 2

Keywords

Wafer Slope, Yield, Customized Wafer, Multiple Linear Regression, Deep Learning