A Study on the Factor Analysis in Semiconductor Manufacturing Process

Publications

Publication Type

Domestic Conference

Contribution Type

Article

Authors

Yoonkyung Shin, Jun Hyeok Gil, Nayeong Lee, & Jang Won Bae

Year

2023

Venue

Spring Joint Conference of the Operations Research Society of Korea and the Korean Institute of Industrial Engineers

Citation

–

Keywords

Deep Learning, Semiconductor Process, Key Factors, Manufacturing Analytics